Step and Flash Imprint Lithography: A Technology Review

نویسندگان

  • T. Bailey
  • B. J. Choi
  • C. G. Willson
چکیده

SIAロードマップ上で予測されている微細な寸法目 標を、大変高価である従来から研究されてきた次世代 リソグラフィ(極UV、電子線投影、X線等)に頼らず に達成するため、インプリントリソグラフィ技術は研 究されている。この技術は半導体LSI以外にもマイク ロ電気機械システム(MEMS)、マイクロ光学、およ びパターン化記憶媒体などへの応用が有望視されてい る。流体排出の基本原理を利用するインプリントリソ グラフィは、像の縮小投影やそれに伴う回折ゆがみの 修正等を一切必要としない利点がある。しかしインプ リントリソグラフィ技術の中でも、より伝統的なマイ クロ鋳造法(m i c r omo l d i n g )や熱型押し法(he a t embossing)などでは、目合わせ精度やスループットに ついて克服しがたい障害が存在する。しかし現在主に テキサス大学オースティン校で開発されつつあるステ ップ・アンド・フラッシュ インプリントリソグラフィ (SFIL)と名づけた技術は、このような課題を克服で きる。この技術では、UVに透明な硬質な型押しテン プレートと、有機平坦化層と低粘性でUV硬化するシ リコン有機物溶液からなる二層レジストを使う。この 詳細を以下に紹介する。

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تاریخ انتشار 2001